Extreme Solarization Resistant Reflection/Backscatter Probes

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PRODUCT

Extreme Solarization Resistant Reflection/Backscatter Probes

A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.

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Extreme Solarization Resistant Reflection/Backscatter Probes

Features

General purpose
XSR fibers
Probe design

specifications

Subject to change depending on model type

Engineering:
Fiber Core Size	230 µm, 450 µm
Jacket	Silicone-coated steel monocoil
Length	2 m
Probe Ferrule Diameter	6.35 mm (1/4″)
Wavelength Range	180nm – 800nm
Breakout	Midway point of assembly at 1 meter
Buffer Materials	Aluminum, Nylon, Silicone, Aluminum, Polymer
Cladding OD	250 µm, 500 µm
Cladding OD Tolerance	± 13 µm, ± 25 µm
Connector	SMA 905
Fiber Core Size Tolerance	± 12 μm, ± 22 μm
Long Term Bend Radius	4 cm, 8 cm
Maximum OD	1300 µm, 380 µm
Maximum OD Tolerance	± 100 µm, ± 20 µm
Numerical Aperture	0.22 ± 0.02 (equivalent to an acceptance angle of 24.8° in air
Primary Buffer OD	300 µm, 580 µm
Probe Ferrule Length	76.2 mm (3″)
Probe Ferrule Material	Stainless steel
Probe Fiber Bundle	6 illumination fibers around 1 read fiber
Short Term Bend Radius	2 cm, 4 cm
Environmental:
Operating Temperature	-50 to 80 °C